Delay Error with Meta-stability Detection and Correction Using Cmos Transmission Logic

نویسندگان

  • Bhawna Kankane
  • Sandeep Sharma
  • Navaid Zafar Rizvi
چکیده

The new technologies are giving the advance systems which are capable to perform multiple operations simultaneously. This all is possible by the scaling technology where the overall chip size get reduced but due to manufacturing and fabrication defects, certain design uncertainty arises thereby affecting the transistor performance by timing related effect. The robust circuit where sufficient margins are given sometime is nothing but a wastage of power to overcome this, hybrid technique called Razor was innovated which scaled the voltage dynamically and automatically detect and correct the timing related defects. This paper proposed a new design for the razor flip flop with CMOS transmission logic. The traditional design used the dynamic logic approach which has the drawback of threshold voltage attenuation which is removed by CMOS transmission logic and the transparency of the logic data at input and output is highly achieved. The overall purpose for such design is to reduce the power and delay of the circuit which is reduced by 0.6mW and 12.11ns respectively and thus increased the overall performance. The complexity of the circuit is also reduced. The analyses of the circuit is done using Cadence virtuoso tool with 45n technology.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Stability Analysis, Control and Modeling of Micro-grid Connected to Wind Turbine: Effect of Optimal Amplified Converter

Wind turbines as a renewable energy are installed and operated as wind farms in various locations with windy climates.  Connecting micro grids to wind turbines can lead to improved power generation and transmission to distribution networks. Therefore, formulating and configuring the micro-grid connected to the wind turbine requires accurate examination of the configuration of the micro-grid wit...

متن کامل

Multiple Bit Error Tolerant Galois Field Architectures Over GF(2m)

Radiation induced transient faults like single event upsets (SEU) and multiple event upsets (MEU) in memories are well researched. As a result of the technology scaling, it is observed that the logic blocks are also vulnerable to malfunctioning when they are deployed in radiation prone environment. However, the current literature is lacking efforts to mitigate such issues in the digital logic c...

متن کامل

Design of Single Electron (SEEL) Encoded Logic Based Hamming Code IC

Digital information system do poses errors, these errors are the consequence of path delay in communication system as some sort of errored signal processing to achieve an error free information. Error detection circuits are pivoted several tropology’s are being implied since the last three decade. In the past CMOS era we see how single electron transistor are incorporated to achieve error free ...

متن کامل

Error Correction Circuit for Single-Event Hardening of Delay Locked Loops

In scaled CMOS processes, the single-event effects generate missing output pulses in Delay-Locked Loop (DLL). Due to its effective sequence detection of the missing pulses in the proposed Error Correction Circuit (ECC) and its portability to be applied to any DLL type, the ECC mitigates the impact of single-event effects and completes its operation with less design complexity without any concer...

متن کامل

14-Bit 1MS/s Cyclic-Pipelined ADC

This paper presents a 14-bit cyclic-pipelined Analog to digital converter (ADC) running at 1 MS/s. The architecture is based on a 1.5-bit per stage structure utilizing digital correction for each stage. The ADC consists of two 1.5-bit stages, one shift register delay line, and digital error correction logic. Inside each 1.5-bit stage, there is one gain-boosting op-amp and two comparators. The A...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2012